Bowers Time 5100 Portable LEEB Hardness Tester - C Probe Adapters Input and saving of PRESET-values

Input and saving of PRESET-values

Bidirectional communication e

Load & Travel Analysis Software

Mark-10 Advanced Ergonomics Kits Series E Pistol Grip

Bowers Time 5100 Portable LEEB Hardness Tester - C Probe Adapters Input and saving of PRESET-valuesTIME 5100 Portable LEEB Hardness Tester C Probe Leeb hardness testing was invented in 1975 in Switzerland and has become one of the most popular portable testing methods currently available. The TIME Leeb Hardness testers are supplied to the industry since 1991 and can be seen as the current global standard for Portable hardness testing. View Product Data Sheet FEATURES Excellent portability for testing anywhere, anytime. Automatic gravity